Nanoscape
Characterization Facilities
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Philips 430T | AEM - Analytical |
| 300kV, LaB6, STEM, EDXS, PEELS (2.0Å / 40Å probe) | ||
| - picture of Philips 430T | ||
| JEOL 4000EX | AREM | |
| High Resolution TEM (1.7Å point-to-point) | ||
| TOPCON 002B | to arrive soon | |
| Philips 400T | CTEM | |
| (120 kV) | ||
| JEOL 5200 | SEM w/link EDXS | |
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| page maintained by Maoxu
Qian and Jing
Su Revised: 24 Jul 1997 12:03:17 -0700. |